The quality of data obtained with the Dimension Icon is strongly dependent on the type and quality of the probe in use. Traditional triangular silicon nitride cantilever probes are robust and relatively inexpensive. Etched silicon cantilevers with integrated tips have a higher aspect ratio and smaller end radius than silicon nitride. The choice of probe depends on multiple variables, such as application and imaging environment. For example, the smaller end radius of etched silicon tips creates greater pressure between the tip and sample. Consequently, these probes are not recommended for soft samples.
For the applications listed below, click to view a table of probe types and characteristics to help you make the optimal choice for your experiment. Further information is also available regarding Probe Selection for Specific Modes.
Probe Family/Model | Imaging Environment | Nominal Specifications | Coatings | Probe Attributes | AFM Mode | ||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Liquid | Air | Force Constant (N/m) | Resonant Frequency (kHz) | Radius of Curvature (nm) | Back Side | Tip Side |
Peak Force/ ScanAsyst |
Tapping | Contact | Force Curves | Electrical | Magnetic | |||
Silicon | TESPA | – |
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42 | 320 | 8 | Al | None | Highest resolution, Asymmetric tip | – |
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– | – | – | – |
RTESPA | – |
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40 | 300 | 8 | Al | None | Highest resolution, Symmetric tip | – |
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– | – | – | – | |
NCHV-A | – |
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42 | 320 | 10 | Al | None | High resolution, Asymmetric tip | – |
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– | – | – | – | |
Silicon Nitride | DNP-S |
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0.06–0.58 | 18–57 | 10 | Au | None | High resolution, Low force, Symmetric tip (sharpened) | – |
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– | – |
MSCT |
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0.01–0.5 | 7–120 | 10 | Au | None | High resolution, Lowest force, Symmetric tip (sharpened) | – |
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– | – | |
SNL |
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0.06–0.58 | 18–57 | 2 | Au | None | Ultra-high resolution, Low force, Symmetric tip (extremely sharp) | – |
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– | – | |
MSNL |
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0.01–0.5 | 7–120 | 2 | Au | None | Ultra-high resolution, Lowest force, Symmetric tip (extremely sharp) | – |
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– | – | |
ScanAsyst - Air |
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0.2–0.8 | 45–95 | 2 | Al | None | Ultra-high resolution, lowest force, symmetric tip (extremely sharp) |
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– | – | – | – | – | |
ScanAsyst - Fluid |
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– | 0.35–1.4 | 100–200 | 20 | Au | None | High resolution, lowest force, symmetric tip (sharpened) |
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– | – | – | – | – | |
ScanAsyst - Fluid+ |
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– | 0.35–1.4 | 100–200 | 2 | Au | None | Ultra-high resolution, lowest force, symmetric tip (extremely sharp) |
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– | – | – | – | – | |
FastScan-A | – |
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10–25 | 0.8–2 MHz | 8 | Al | None | Highest resolution, symmetric tip, higher optical sensitivity and lower force | – |
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– | – | – | – | |
FastScan-B |
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– | 1–3 | 300–600 | 8 | Ti/Au | None | Highest resolution, symmetric tip, higher optical sensitivity and lower force |
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– |
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– | – | |
FastScan-C |
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– | 0.4–1.2 | 130–290 | 8 | Ti/Au | None | Highest resolution, symmetric tip, higher optical sensitivity and lower force |
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– |
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– | – |
Probe Family/Model | Imaging Environment | Nominal Specifications | Coatings | Probe Attributes | AFM Mode | ||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Liquid | Air | Force Constant (N/m) | Resonant Frequency (kHz) | Radius of Curvature (nm) | Back Side | Tip Side | Peak Force/ ScanAsyst | Tapping | Contact | Force Curves | Electrical | Magnetic | |||
Silicon Nitride | DNP |
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– | 0.06–0.58 | 18–57 | 20 | Au | None | Low force, Symmetric tip | – |
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– | – |
MLCT |
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– | 0.01–0.5 | 7–120 | 20 | Au | None | Lowest force, Symmetric tip | – |
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– | – | |
FastScan-B |
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– | 1–3 | 300–600 | 8 | Ti/Au | None | Highest resolution, symmetric tip, higher optical sensitivity and lower force |
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– | – | |
FastScan-C |
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– | 0.4–1.2 | 130–290 | 8 | Ti/Au | None | Highest resolution, symmetric tip, higher optical sensitivity and lower force |
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– | – |
Probe Family/Model | Imaging Environment | Nominal Specifications | Coatings | Probe Attributes | AFM Mode | ||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Liquid | Air | Force Constant (N/m) | Resonant Frequency (kHz) | Radius of Curvature (nm) | Back Side | Tip Side | Peak Force/ ScanAsyst | Tapping | Contact | Force Curves | Electrical | Magnetic | |||
Silicon | TESPA | – |
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42 | 320 | 8 | Al | None | Highest resolution, Asymmetric tip | – |
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– | – | – | – |
RTESPA | – |
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40 | 300 | 8 | Al | None | Highest resolution, Symmetric tip | – |
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– | – | – | – | |
NCHV-A | – |
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42 | 320 | 10 | Al | None | High resolution, Asymmetric tip | – |
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– | – | – | – | |
Silicon Nitride | DNP |
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– | 0.06–0.58 | 18–57 | 20 | Au | None | Low force, Symmetric tip | – |
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– | – |
DNP-S |
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– | 0.06–0.58 | 18–57 | 10 | Au | None | High resolution, Low force, Symmetric tip (sharpened) | – |
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– | – | |
MLCT |
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– | 0.01–0.5 | 7–120 | 20 | Au | None | Lowest force, Symmetric tip | – |
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– | – | |
MSCT |
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– | 0.01–0.5 | 7–120 | 10 | Au | None | High resolution, Lowest force, Symmetric tip (sharpened) | – |
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– | – | |
SNL |
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– | 0.06–0.58 | 18–57 | 2 | Au | None | Ultra-high resolution, Low force, Symmetric tip (extremely sharp) | – |
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– | – | |
MSNL |
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– | 0.01–0.5 | 7–120 | 2 | Au | None | Ultra-high resolution, Lowest force, Symmetric tip (extremely sharp) | – |
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– | – | |
ScanAsyst - Air |
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0.2–0.8 | 45–95 | 2 | Al | None | Ultra-high resolution, lowest force, symmetric tip (extremely sharp) |
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– | – | – | – | – | |
ScanAsyst - Fluid |
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– | 0.35–1.4 | 100–200 | 20 | Au | None | High resolution, lowest force, symmetric tip (sharpened) |
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– | – | – | – | – | |
ScanAsyst - Fluid+ |
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– | 0.35–1.4 | 100–200 | 2 | Au | None | Ultra-high resolution, lowest force, symmetric tip (extremely sharp) |
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– | – | – | – | – | |
FastScan-B |
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– | 1–3 | 300–600 | 8 | Ti/Au | None | Highest resolution, symmetric tip, higher optical sensitivity and lower force |
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– |
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– | – | |
FastScan-C |
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– | 0.4–1.2 | 130–290 | 8 | Ti/Au | None | Highest resolution, symmetric tip, higher optical sensitivity and lower force |
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– |
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– | – |
Probe Family/Model | Imaging Environment | Nominal Specifications | Coatings | Probe Attributes | AFM Mode | ||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Liquid | Air | Force Constant (N/m) | Resonant Frequency (kHz) | Radius of Curvature (nm) | Back Side | Tip Side | Peak Force/ ScanAsyst | Tapping | Contact | Force Curves | Electrical | Magnetic | |||
Silicon | FESP | – |
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2.8 | 75 | < 10 | None | None | High resolution, Lower force, Asymmetric tip | – |
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– |
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– | – |
TESPA | – |
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42 | 320 | 8 | Al | None | Highest resolution, Asymmetric tip | – |
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– |
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– | – | |
LTESP | – |
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48 | 190 | < 10 | None | None | Highest resolution, Long lever, Asymmetric tip | – |
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– |
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– | – | |
NCHV-A | – |
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42 | 320 | 10 | Al | None | High resolution, Asymmetric tip | – |
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– |
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– | – | |
Silicon Nitride | DNP |
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0.06–0.58 | 18–57 | 20 | Au | None | Low force, Symmetric tip | – |
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– | – |
MLCT | – |
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0.01–0.5 | 7–120 | 20 | Au | None | Lowest force, Symmetric tip | – | – |
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– | – | |
SNL |
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0.06–0.58 | 18–57 | 2 | Au | None | Ultra-high resolution, Low force, Symmetric tip (extremely sharp) | – |
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– | – | |
ScanAsyst - Fluid+ |
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0.2–0.8 | 45–95 | 2 | Al | None | Ultra-high resolution, lowest force, symmetric tip (extremely sharp) |
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– | – | – | – | – | |
ScanAsyst - Fluid+ |
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– | 0.35–1.4 | 100–200 | 20 | Au | None | High resolution, lowest force, symmetric tip (sharpened) |
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– | – | – | – | – | |
ScanAsyst - Fluid+ |
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– | 0.35–1.4 | 100–200 | 2 | Au | None | Ultra-high resolution, lowest force, symmetric tip (extremely sharp) |
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– | – | – | – | – | |
FastScan-A | – |
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10–25 | 0.8–2 MHz | 8 | Al | None | Highest resolution, symmetric tip, higher optical sensitivity and lower force |
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– |
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– | – | |
FastScan-B |
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– | 1–3 | 300–600 | 8 | Ti/Au | None | Highest resolution, symmetric tip, higher optical sensitivity and lower force |
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– |
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– | – | |
FastScan-C |
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– | 0.4–1.2 | 130–290 | 8 | Ti/Au | None | Highest resolution, symmetric tip, higher optical sensitivity and lower force |
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– | – |
Probe Family/Model | Imaging Environment | Nominal Specifications | Coatings | Probe Attributes | AFM Mode | ||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Liquid | Air | Force Constant (N/m) | Resonant Frequency (kHz) | Radius of Curvature (nm) | Back Side | Tip Side | Peak Force/ ScanAsyst | Tapping | Contact | Force Curves | Electrical | Magnetic | |||
Silicon | TESPA | – |
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42 | 320 | 8 | Al | None | Highest resolution, Asymmetric tip | – |
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– | – | – | – |
RTESPA | – |
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40 | 300 | 8 | Al | None | Highest resolution, Symmetric tip | – |
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– | – | – | – | |
NCHV-A | – |
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42 | 320 | 10 | Al | None | High resolution, Asymmetric tip | – |
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– | – | – | – | |
Modified Silicon | MESP-RC | – |
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2.8 | 75 | 25 | Co/Cr | Co/Cr | High performance, Magnetic characterization, Asymmetric tip | – |
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– | – |
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SCM-PIC | – |
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0.2 | 13 | 20 | PtIr | PtIr | High performance, Electrical characterization, Asymmetric tip | – | – |
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– |
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– | |
SCM-PIT | – |
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2.8 | 75 | 20 | PtIr | PtIr | High performance, Electrical characterization, Asymmetric tip | – |
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– | – |
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– | |
DDESP | – |
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42 | 320 | 35 | Doped Diamond | Al | Conductive, with increased wear resistance | – | – |
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– |
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– | |
Silicon Nitride | DNP |
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0.06–0.58 | 18–57 | 20 | Au | None | Low force, Symmetric tip | – |
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– | – | – |
SNL |
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0.06–0.58 | 18–57 | 2 | Au | None | Ultra-high resolution, Low force, Symmetric tip (extremely sharp) | – |
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– | – | – | |
ScanAsyst - Fluid+ |
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0.2–0.8 | 45–95 | 2 | Al | None | Ultra-high resolution, lowest force, symmetric tip (extremely sharp) |
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– | – | – | – | – | |
ScanAsyst - Fluid+ |
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– | 0.35–1.4 | 100–200 | 20 | Au | None | High resolution, lowest force, symmetric tip (sharpened) |
![]() |
– | – | – | – | – | |
ScanAsyst - Fluid+ |
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– | 0.35–1.4 | 100–200 | 2 | Au | None | Ultra-high resolution, lowest force, symmetric tip (extremely sharp) |
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– | – | – | – | – | |
FastScan-A | – |
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10–25 | 0.8–2 MHz | 8 | Al | None | Highest resolution, symmetric tip, higher optical sensitivity and lower force |
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– |
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– | – | |
FastScan-B |
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– | 1–3 | 300–600 | 8 | Ti/Au | None | Highest resolution, symmetric tip, higher optical sensitivity and lower force |
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– |
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– | – | |
FastScan-C |
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– | 0.4–1.2 | 130–290 | 8 | Ti/Au | None | Highest resolution, symmetric tip, higher optical sensitivity and lower force |
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– | – |
www.bruker.com | Bruker Corporation |
www.brukerafmprobes.com | 112 Robin Hill Rd. |
nanoscaleworld.bruker-axs.com/nanoscaleworld/ | Santa Barbara, CA 93117 |
Customer Support: (800) 873-9750 | |
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